TwinPort™ - Hipot & Gound Bond Test Features Cut Test Time in Half

CHROMA'S PATENTED TWINPORT™ FUNCTION ALLOWS FOR SIMULTANEOUS TESTING OF GROUND BOND AND HIPOT CUTTING TEST TIME IN HALF

 

 

 

 

 

 

 

 

When manufacturers are producing high volumes of product, even a few seconds saved can equate to improved process times and higher volumes. Simultaneous testing of Ground Bond and Hipot can cut the actual test times in half, saving the manufacturer process time and money. Chroma has also developed high voltage and high current multiplexers to allow for multiple products to be tested from a single safety test device. These are referred to as Scanners and Multiplexers and vary from one or two devices to tens and hundreds of devices.